Comparing depth profiling of oxide scale on SOFC interconnect-materials using ToF-SIMS with 69Ga+, Bi3+/Cs+ and C60+/C602+ as primary and sputter ions

In a paper by J. Hall, U. Bexell, J. S. Fletcher, S. Canovic and P. Malmberg, Oxide scale cross-sections of CeO2 coated FeCr based solid oxide fuel cell interconnect materials were examined using secondary ion mass spectrometry (SIMS) depth profiling. Secondary ion mass spectrometry sputter depth profiles using different ion sources; 69Ga+, Bi3+/Cs+ and C60+/C602+ were compared with TEM oxide scale cross-section and field emission gun–Auger electron spectroscopy depth profiling. The C60cluster ion depth profiles were less sensitive to type of matrix and gave the best correspondence to the TEM cross-section.

Read more in Materials at high temperatures

Spatial Neuroproteomics Using Imaging Mass Spectrometry

Check out this review by Jörg Hanrieder, Per Malmberg and Andrew G. Ewing on neuroproteomics in BBA Proteins and Proteomics .


•Imaging MS allows for spatial protein and peptide profiling at high molecular specificity.
•Recent developments push the limits in terms of spatial resolution, sensitivity and specificity.
•A concise overview of IMS based approaches for protein and peptide imaging is presented.
•Technical concepts and developments of IMS are discussed.
•Implementations of IMS for biomedical applications in neuroscience are presented.

Improved Molecular Imaging in Rodent Brain with Time-of-Flight-Secondary Ion Mass Spectrometry Using Gas Cluster Ion Beams and Reactive Vapor Exposure

An exiting new paper on demonstrating the advantages of using gas cluster ion beams (GCIBs) in combination with trifluoracetic acid (TFA) vapor exposure for the imaging of lipids in mouse brain sections. There is an optimum exposure to TFA that is beneficial for increasing high mass signal as well as producing signal from previously unobserved species in the mass spectrum. Cholesterol enrichment and crystallization on the sample surface is removed by TFA exposure uncovering a wider range of lipid species in the white matter regions of the tissue, greatly expanding the chemical coverage and the potential application of TOF-SIMS imaging in neurological studies. Ar4000+ (40 keV) in combination with TFA treatment facilitates high resolution, high mass imaging closing the gap between TOF-SIMS and matrix-assisted laser desorption ionization (MALDI).


Read the paper by Tina B. Angerer, Masoumeh Dowlatshahi Pour, Per Malmberg, and John S. Fletcher in Analytical Chemistry.